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Microscopía de fuerza piezoeléctrica directa (DPFM)

Resumen

Tipo:
Oferta Tecnológica
Referencia:
TOES20160912001
Publicado:
14/09/2016
Caducidad:
14/09/2017
Resumen:
Una institución pública española ha desarrollado un microscopio de fuerza atómica (AFM) basado en un modo capaz de representar la carga piezoeléctrica generada mediante el efecto piezoeléctrico directo y obtener valores cuantitativos de la constante piezoeléctrica. Se trata de una herramienta fiable y precisa para comprender la dinámica de generación de la carga piezoeléctrica. Se buscan empresas con el fin de explotar el know-how mediante un acuerdo de licencia de patente.

Details

Tittle:
Direct Piezoelectric Force Microscopy (DPFM)
Summary:
A Spanish public institution has developed an Atomic Force Microscope (AFM) based mode capable of mapping the piezoelectric charge generated through the direct piezoelectric effect, and obtaining quantitative values of the piezoelectric constant. This is a reliable and precise tool for the understanding of the piezocharge generation dynamics.
Companies are being sought to exploit the existing know-how through a patent license agreement.
Description:
At present, the only AFM mode for measuring the piezoelectric effect of a material is the "converse piezoelectric effect" which takes place when a strain is produced upon application of an electric field. However, in some cases, this technique presents problems for quantitative analysis of the piezoelectric coefficient based on wrong electromechanical response of the AFM tip that not exclusively depends on the piezo signal, but on other physical effects.
The proposed mode uses a specific amplifier for measuring the charge generated by the materials which directly obtains quantitative values of the piezoelectric constant. The charge generated by direct piezoelectric effect has been proven to be linear with the applied force and does not depend on other physical effects.
The main characteristic of the setup is its very low leakage current, so that almost all the charge generated by the material can be read by the amplifier. It also has a record bandwidth that measures signals in the order of femtoAmpere and 5 Hz frequency.
The system allows two types of measures:
- Quantitative images of the material under study, valid for ferroelectric materials.
- Spectroscopy experiments, valid for both piezoelectric and ferroelectric materials.

The Spanish public institution is searching for manufacturers from the Scientific Instrumentation sector that can be interested in the commercialization of this mode, under a patent license.
Advantages and Innovations:
- Precise, reliable and economic technique for both piezoelectric and ferroelectric materials.
- Easy assembly and implementation in any commercial AFM
- Great potential to generate further scientific discoveries in the piezoelectric/flexoelectric charge generation dynamics, electronic industry, ferroelectric materials developments, transducers or new developed sensors.
- Compatible with Piezoresponse Force Microscopy (PFM), being possible to perform DPFM+PFM simultaneously.
Stage of Development:
Available for demonstration
IPs:
Patent(s) applied for but not yet granted

Partner sought

Type and Role of Partner Sought:
We are looking for industrial partners from the Scientific Instrumentation sector that can be interested in the use or commercialization of this method, under a patent license.

Client

Type and Size of Client:
R&D Institution
Already Engaged in Trans-National Cooperation:
No
Languages Spoken:
English
Spanish

Keywords

Technology Keywords:
05005 Micro y nanotecnología