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Nueva técnica de bajo coste basada en termografía lock-in para monitorización cuantitativa de sistemas electrónicos inalámbricos

Resumen

Tipo:
Oferta Tecnológica
Referencia:
TOES20150617001
Publicado:
01/09/2016
Caducidad:
28/02/2017
Resumen:
Un centro de investigación español acaba de desarrollar una técnica basada en termografía lock-in para el análisis funcional y monitorización del consumo cuantitativo de energía en sistemas electrónicos inalámbricos y pad-free. Este enfoque es rápido, espacialmente resuelto, no invasivo, no destructivo y fácil de implementar en sistemas de control de calidad en procesos industriales. El centro de investigación busca socios industriales para explotar el know-how mediante un acuerdo de licencia de patente.


Details

Tittle:
New low cost lock-in thermographic-based technique for quantitative monitoring of electronic wireless systems
Summary:
Researchers from a Spanish research institution have recently developed a lock-in thermography-based technique for functional analysis and quantitative power consumption monitoring in wirelessly powered and pad-free electronic systems. This approach is fast, spatially-resolved, noninvasive, nondestructive, and of easy implementation in quality control systems for industrial processes. Industrial partners are being sought to exploit the existing know-how through a patent licence agreement.
Description:
Nowadays the use of wirelessly powered systems is being extended to more and more applications, such as product tracking, identifications, asset management, logistics, payment, etc., meaning that their design has become also far more demanding from the point of view of their constituting functional parts and powering system robustness. Besides, their fabrication process requires reliable monitoring techniques to detect,
localize and quantitatively analyze electrical dysfunctions related with their functional behavior or powering system.
The developed technique can be easily implemented into most of
commercial infrared (IR) thermographic cameras and used as a quality control system for wireless electronic devices not only due to its noninvasive, nondestructive and spatial resolved characteristics, but also the quantitative nature of the measurement. Through the proposed modulations, the analysis of the individual parts of the system or integrated circuit (IC) and their possible electrical interactions can be performed. Additionally, it can be applied to other imaging temperature sensing systems. Industrial partners in particular fabricants of wireless electronic devices are being sought to exploit the existing know-how through a patent licence agreement.
Advantages and Innovations:
- Diagnostic imaging technique (6 microns spatial resolution with the used IR camera) oriented to wirelessly powered integrated systems under real operation.
- Locally permits quantitative consumption and functional analyses.
- As non-invasive and non-destructive technique allows fast control in integrated systems, even applicable in wire bonding-free chips.
- Can be easily implemented in any other imaging temperature sensing
system.
- Lower cost and faster (sample preparation, processing, etc.) than other mainstream techniques like SQUID-based systems, EBIC, OBIC, OBIRCH.
- Integrated approach in industrial processes suitable as quality control system for any integrated systems debugging (at powering and functional level), functional and quantitative consumption analysis, figures of merit extraction in frequency, etc...
Stage of Development:
Available for demonstration
IPs:
Patent(s) applied for but not yet granted
CommeR Statunts Regarding IPR Status:
Spanish Priority Patent

Partner sought

Type and Role of Partner Sought:
Industrial partners in particular fabricants of wireless electronic devices are being sought to exploit the existing know-how through a patent licence agreement.

Client

Type and Size of Client:
R&D Institution
Already Engaged in Trans-National Cooperation:
No
Languages Spoken:
English

Keywords

Technology Keywords:
09004 Dispositivos de registro
02003005 Information processing & Systems, Workflow
02003001 Process automation
09003 Sistemas electrónicos de medida