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Patrón de calibración espacial y de conductividad en microscopios de fuerza atómica

Resumen

Tipo:
Oferta Tecnológica
Referencia:
TOES20170328001
Publicado:
19/05/2017
Caducidad:
19/05/2018
Resumen:
Un investigador español ha desarrollado un procedimiento sencillo para fabricar patrones de calibración aptos para microscopios de fuerza atómica (AFM). Un único patrón sirve para calibrar la geometría y la corriente simultáneamente. Se buscan socios en la industria de fabricación de microscopios de fuerza atómica con el fin de licenciar la patente.

Details

Tittle:
A unique calibration pattern for spatial and conductive modes in Atomic Force Microscopes
Summary:
Spanish researcher have developed an easy procedure for manufacturing calibration patterns suitable for Atomic
Force Microscopes (AFM). A unique pattern supports a simultaneous geometrical and current calibration for the sample.
Industrial partners from manufacturing industry of Atomic Force Microscopes are being sought to collaborate through a patent licence agreement.
Description:
One of the most commonly challenge encountered when using an Atomic Force Microscope (AFM) is its calibration. Although, for the spatial calibration, there are different types of standard samples or calibration patterns, which are generally supplied by AFM equipment manufacturers,
for calibration of other AFM measurement modes, in particular when the system is used for electrical current measurement (c-AFM), no standards samples have been commercially available.
The current development of a method that allows an easy fabrication of calibration pattern for an AFM that simultaneously support it in geometry and conductive mode make it very suitable to be rapidly implemented as standard setup in commercial AFM equipment.

Industrial partners from manufacturing industry of Atomic Force Microscopes are being sought to collaborate through a patent licence agreement.
Advantages and Innovations:
- Easy fabrication method for a calibration pattern.
- Two-fold and simultaneous functionality of the calibration pattern (by setup in geometry and/or conductive mode).
- Same pattern suitable for thick and fine calibration in AFM measurements.
Stage of Development:
Prototype available for demonstration
IPs:
Patent(s) applied for but not yet granted
CommeR Statunts Regarding IPR Status:
Spanish patent application filed

Partner sought

Type and Role of Partner Sought:
Atomic Force Microscope manufacturers interested on methodes for AFM´s calibration patterns fabrication.

Client

Type and Size of Client:
R&D Institution
Already Engaged in Trans-National Cooperation:
No
Languages Spoken:
English
German
Spanish

Keywords

Technology Keywords:
09005 Materiales de referencia
02007009 Materials Handling Technology (solids, fluids, gases)
09001008 Otros ensayos no destructivos